![]() ![]() Electrons which are removed from an atom are FREE ELECTRONS. This means that the main effect of an x-ray on an atom is to remove electrons. For this reason, all calculations involve calculation of the Amplitude of the diffracted beam which is finally squared to yield the intensity in the last step. the relative positions and compositions in real space. The important information concerning positioning of electrons in a crystal involve PHASE INFORMATION, i.e. The calculation of the intensity of a diffraction line involves a mathematical "building-up" of the crystal starting with electrons which are the source of the diffracted beam, atomic structure (atomic form factor), unit lattice site composition and finally crystal structure. ![]() Finally, the diffracted intensity is used to determine the composition. Also, sinceĭifferent peaks have different intensities, calculation of the intensity can yield additional information for indexing. The reason for this will becomeĮvident if we consider the calculation of the diffracted intensity. Intensity results in no intensity meaning that some of the lines predicted byīragg's Law will not be observed in the pattern. Peaks (as we saw in diamond cubic and FCC) the calculation of the diffracted One reason that this is important is that for some diffraction ![]() So far we have dealt only with the angular position and it's description with Bragg's Law.Ĭhapter 4 deals with the calculation of the intensity of aĭiffracted beam. The diffraction pattern from a crystalline samples contains 2 pieces of information for eachġ) the angular position of the diffraction line and Development of a Model for Diffracted Intensity ![]()
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